›› 2019, Vol. 39 ›› Issue (9): 774-778.

• 基础研究 • 上一篇    下一篇

不同器械邻面去釉抛光前后釉质表面粗糙度的比较

李宁宁1,葛悦1,庞婉毓1,李祥2,白璐1,吴聿淼1,朱宪春3   

  1. 1. 吉林大学口腔医院
    2. 吉林大学口腔医院正畸科三诊
    3. 吉林大学口腔医学院
  • 收稿日期:2019-01-21 修回日期:2019-04-18 出版日期:2019-09-28 发布日期:2019-09-17
  • 通讯作者: 朱宪春 E-mail:15344310555@163.com
  • 基金资助:
    吉林省地方标准

The effect of different instruments of interproximal enamel reduction(IER) on enamel surface roughness before and after polishing.

  • Received:2019-01-21 Revised:2019-04-18 Online:2019-09-28 Published:2019-09-17

摘要: 目的 通过离体牙的邻面去釉实验,比较不同器械邻面去釉抛光前后对釉质表面粗糙度的影响。 方法 选择因正畸需要拔除的前磨牙60颗,随机分为6个组。各组采用不同的去釉器械进行邻面去釉,Ⅰ:金钢砂车针(medium);Ⅱ:金钢砂车针(fine);Ⅲ:金钢砂条(medium);Ⅳ:金钢砂条(fine);Ⅴ:金钢砂盘;Ⅵ:对照组(未去釉组)。去釉完成后实验组随机选一个面使用SofLex抛光系统对去釉面进行抛光。用激光共聚焦显微镜分别检测去釉面和抛光面的表面粗糙度并观察其表面形貌。并采用SPSS 18.0统计软件对结果进行单因素方差分析。 结果 ①邻面去釉后未抛光时Ⅰ组和Ⅲ组表面粗糙度最大,两者之间没有统计学差异(P= 0.632),其次是Ⅱ、Ⅳ、Ⅴ组,且均高于Ⅵ组。②邻面去釉抛光后Ⅰ、Ⅱ、Ⅲ、Ⅳ、Ⅴ组表面粗糙度显著降低,组间无统计学差异,且均小于Ⅵ组。③激光共聚焦显微镜观察:邻面去釉后实验组均在去釉区釉质表面留下了划痕,Ⅰ、Ⅱ组比Ⅲ、Ⅳ、Ⅴ形成的划痕更深,Ⅴ组形成的划痕最浅;邻面去釉抛光后Ⅰ、Ⅱ、Ⅲ、Ⅳ、Ⅴ组无明显差异,SofLex抛光系统基本消除了邻面去釉操作在去釉区釉质表面留下的划痕。 结论 ①不同的邻面去釉器械会不同程度地增加釉质表面的粗糙度,金钢砂车针(medium)和金钢砂条(medium)去釉后釉质表面粗糙度最大,其次是金钢砂车针(fine)、金钢砂条(fine),金钢砂盘去釉后釉质的表面粗糙度最小。②不同的邻面去釉器械去釉后使用SofLex抛光系统抛光会降低釉质的表面粗糙度,各组间无差异,且均低于未去釉的釉质表面粗糙度。

关键词: 邻面去釉, 粗糙度, 激光共聚焦显微镜, 牙釉质

Abstract: Objective To compare the effects of different instruments of interproximal enamel reduction(IER) on enamel surface roughness before and after polishing. Methods Sixty healthy premolars were used after removal for orthodontic reasons and divided into six groups. Each group underwent IER with different IER instruments:Ⅰ:diamond burs(medium);Ⅱ:diamond burs(fine);Ⅲ: handheld diamond strips(medium);Ⅳ: handheld diamond strips(fine);Ⅴ:diamond discs; Ⅵ:control group(no IER). One proximal surface of sample after IER was polished with SofLex polishing discs.Striped and polished surface roughness was assessed and morphology was observed respectively using laser scaning confocal microscopy(LSCM). Results ①After IER but before polishing, groupⅠand groupⅢ had the roughest surfaces (no statistically significant,P= 0.632),followed by groupⅡ, Ⅳ, Ⅴ,and these surfaces were significantly rougher than the control surfaces; ②The enamel surface roughness of the groupⅠ,Ⅱ, Ⅲ, Ⅳ,Ⅴdecreased significantly after polishing(no significant difference between groups), and these surfaces are smoother than the control surfaces. ③LSCM image: After IER,groupⅠ,Ⅱ, Ⅲ, Ⅳ,Ⅴ all produced enamel furrows and scratches, groupⅠ,Ⅱcreated deeper furrows and scratches than group Ⅲ, Ⅳ,Ⅴ, and group Ⅴproduced the shallowest scratches. Polishing with SofLex polishing discs after IER basically eliminated the scratches that were created by IER(no significant difference between groups Ⅰ, Ⅱ, Ⅲ, Ⅳ and Ⅴ). Conclusions ①Different IER instruments will increase enamel surfaces roughness to different extents. Enamel surfaces treated with diamond burs (medium)and diamond strips(medium) were the roughest, followed by diamond burs (fine), diamond strips(fine) strips,and treated with diamond discs are the smoothest. ②Polishing with SofLex polishing discs after IER with different instruments reduced the enamel surface roughness(no significant difference between groups), and these surfaces are smoother than untreated enamel. 

Key words: interproximal enamel reduction(IER), roughness, laser scaning confocal microscopy(LSCM), enamel

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