›› 2021, Vol. 41 ›› Issue (12): 1081-1087.

• 临床研究 • 上一篇    下一篇

数字化??板在骨性Ⅲ类错??患者双颌手术中的应用及评价

林雯1,王羽立1,杜一飞2,程杰1,江宏兵1,万林忠1,袁华1   

  1. 1. 南京医科大学附属口腔医院
    2. 江苏省口腔医院
  • 收稿日期:2021-04-12 修回日期:2021-08-21 出版日期:2021-12-28 发布日期:2021-12-31
  • 通讯作者: 袁华 E-mail:rolener@sina.com

Application and evaluation of digital wafers in bimaxillary orthognathic surgery for patients with skeletal Class III malocclusion

  • Received:2021-04-12 Revised:2021-08-21 Online:2021-12-28 Published:2021-12-31

摘要: 目的:验证数字化??板在骨性III类错??患者双颌手术中应用的可行性与可靠性,并与传统??板比较。方法:选取40名实施双颌手术的骨性III类错??患者,分为传统??板组与数字化??板组,各20名。在ProPlan CMF 3.0中测量比较设计与实际颅颌模型中14个测量点到参考平面的距离与3个测量平面与参考平面的角度,并比较传统??板组与数字化??板组的模拟及实际的差值。结果:数字化??板组术前模拟与术后实际颅颌模型的所有线性测量指标之间的差值均小于2mm,角度测量指标的差值均小于4°。数字化??板组的L1-Y、GoL-X、GoL-Y、GoR-X、GoR-Y、CoL-Y、CoR-Y的模拟与实际值之间具有统计学差异(P≤0.042)。传统??板组与数字化??板组的L6L-X、GoR-X、LOP-X、MP-X、GoL-Y、MP-Z的模拟与实际的差值有统计学差异(P≤0.046)。结论:数字化??板在双颌手术中的应用安全可靠并且较传统??板更为精确有效。

关键词: 骨性III类错??, 双颌手术, 三维头影测量, 数字化??板

Abstract: Objective  To verify the feasibility and reliability of digital wafers in bimaxillary surgery for skeletal Class III malocclusion patients and compare the accuracy of digital wafers with traditional wafers. Method Forty patients with skeletal Class III malocclusion who performed bimaxillary surgery were divided into traditional wafer group and digital wafer group, 20 in each group. In ProPlan CMF 3.0 software, the linear distance from 14 hard tissue measurement points to three reference planes was measured and the angles between the three selected measurement planes and the three reference planes were measured. Simulative and real difference between traditional wafer group and digital wafer group was compared. Result The difference between simulative and real linear measurement indexes of digital wafer group was less than 2 mm, and the difference of angle measurement indexes was less than 4°. L1-Y, GoL-X, GoL-Y, GoR-X, GoR-Y, CoL-Y and CoR-Y in digital wafer group had statistical differences between simulation and reality (P≤0.042). There were statistical differences between the traditional wafer group and the digital wafer group in L6L-X, GoR-X, LOP-X, MP-X, GoL-Y and MP-Z (P≤0.046). Conclusion The application of digital wafers in bilateral surgery is safe and reliable, and is more accurate and effective than traditional wafers.

Key words: Skeletal class III malocclusion, Bilateral surgery, Three-dimensional cephalometric measurement, Digital wafers

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